Evaluates: MAX40002–MAX40005

MAX40012–MAX40015

MAX40002–MAX40005

Evaluation Kits

General Description

The MAX40002–MAX40005 evaluation kits (EV kits) are

fully assembled and tested PC boards that evaluate

the

MAX40002ANS02–MAX40005ANS02

single

comparators. The MAX40002ANS02–MAX40005ANS02

with an internal reference voltage of 0.2V, and have a

wide 0.1V to 5.5V input voltage (IN) range. These EV kits

demonstrate the MAX40002ANS02–MAX40005ANS02 in

an ultra-small, 0.76mm x 0.76mm, 4-bump wafer-level

package (WLP) with 0.35mm bump spacing.

These EV kits are configured to evaluate all devices in

the MAX40002–MAX40005/MAX40012–MAX40015 family

that have a 4-bump wafer-level package (WLP). To evalu-

ate other WLP devices in this MAX40002–MAX40005/

MAX40012–MAX40015 family other than what is pre-

installed, replace the U1 IC with the desired part (see

Ordering Information for details).

Features

● 0.1V to 5.5V Input Voltage Range

● 1.7V to 5.5V External Reference Range

(MAX40002ANS─MAX40005ANS)

(MAX40002ANS_ _─MAX40005ANS_ _)

• 0.2V, 0.5V, 0.9V, and 1.222V Internal Reference

Options Available

● Evaluates 4-Bump WLP Package

● Fully Assembled and Tested

19-8554; Rev 1; 2/20

Ordering Information appears at the end of the data sheet.

Quick Start

Required Equipment

Before beginning, the following equipment is needed:

● One digital multimeter (DMM)

Procedure

The MAX40002–MAX40005 EV kits are fully assembled

and tested. Follow these steps to verify board operation.

Do

not turn on the power supply until all connections are

completed.

1) Connect the positive terminal of a DC power supply to

2) Connect the positive terminal of a DC power supply to

(MAX40002/MAX40003/MAX40012/MAX40013 only).

3) Connect the positive terminal of a DC power supply to

the IN pad and the ground terminal to the GND pad.

desired level.

desired level (MAX40002/MAX40003/MAX40012/

MAX40013 only).

6) Turn on the IN power supply and set it to the

desired level.

7) Monitor the output using a DMM at the OUT pad,

and study its response to varying voltage at IN (see

Table 1 for more information).