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ST3485EB 数据表(PDF) 11 Page - STMicroelectronics |
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ST3485EB 数据表(HTML) 11 Page - STMicroelectronics |
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11 / 24 page ![]() ST3485EB, ST3485EC, ST3485EI, ST3485EIY Test circuits and typical characteristics DocID9102 Rev 11 11/24 Figure 5: Drive differential output delay transition time test circuit 1. The input pulse is supplied by a generator with the following characteristics: PRR = 250 kHz, 50 % duty cycle, tr ≤ 6.0 ns, ZO = 50 Ω. 2. CL includes probe and stray capacitance Figure 6: Drive differential output delay transition time waveform Figure 7: Drive enable and disable times test circuit (pull-down configuration) 1. The input pulse is supplied by a generator with the following characteristics: PRR = 250 kHz, 50 % duty cycle, tr ≤ 6.0 ns. 2. CL includes probe and stray capacitance IN (1) D VCC CL RL = 60 Ω CL = 15 pF (2) OUT IN OUT 1.5 V tDO tDD 3 V 0 V 2 V -2 V 50 % 10 % 90 % t TD 1.5 V t TD 50 % 10 % 90 % 0 V or 3 V IN (1) D S1 CL = 50 pF (2) RL = 110 Ω OUT |
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