STM32WB10CC datasheet(36/110 Pages) STMICROELECTRONICS

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Functional overview

STM32WB10CC

36/110

DS13259 Rev 2

The NVIC benefits are the following:



Closely coupled NVIC gives low latency interrupt processing



Interrupt entry vector table address passed directly to the core



Allows early processing of interrupts



Processing of late arriving higher priority interrupts



Support for tail chaining



Processor state automatically saved



Interrupt entry restored on interrupt exit with no instruction overhead

The NVIC hardware block provides flexible interrupt management features with minimal

interrupt latency.

3.13.2

Extended interrupts and events controller (EXTI)

The EXTI manages wakeup through configurable and direct event inputs. It provides



wake-up requests to the Power control, and generates interrupt requests to the CPUx NVIC

and events to the CPUx event input.

Configurable events/interrupts come from peripherals able to generate a pulse, and make it

possible to select the Event/Interrupt trigger edge and/or a SW trigger.

Direct events/interrupts are coming from peripherals having their own clearing mechanism.

3.14

Analog to digital converter (ADC)

The 12-bit analog-to-digital converter has up to ten external and three internal (temperature

sensor, voltage reference, VBAT voltage measurement) channels and performs conversions

in single-shot or scan modes. In scan mode, automatic conversion is performed on a

selected group of analog inputs.

An analog watchdog feature makes possible a very precise monitoring of the converted

voltage of one, some or all selected channels. An interrupt is generated when the converted

voltage is outside the programmed thresholds.

3.14.1

Temperature sensor

The temperature sensor (TS) generates a voltage VTS that varies linearly with temperature.

The temperature sensor is internally connected to the ADC1_IN12 input channel, which is

used to convert the sensor output voltage into a digital value.

To improve the accuracy of the temperature sensor measurement, each device is

individually factory-calibrated by ST. The temperature sensor factory calibration data are

stored in the system memory area, accessible in read-only mode.

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