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STM32L151CCU6 数据表(PDF) 81 Page - STMicroelectronics |
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STM32L151CCU6 数据表(HTML) 81 Page - STMicroelectronics |
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81 / 136 page ![]() DocID022799 Rev 13 81/136 STM32L151xC STM32L152xC Electrical characteristics 109 Flash memory and data EEPROM Table 36. Flash memory and data EEPROM characteristics Symbol Parameter Conditions Min Typ Max(1) 1. Guaranteed by design. Unit VDD Operating voltage Read / Write / Erase -1.65 - 3.6 V tprog Programming/ erasing time for byte / word / double word / half-page Erasing - 3.28 3.94 ms Programming - 3.28 3.94 IDD Average current during the whole programming / erase operation TA = 25 °C, VDD = 3.6 V - 600 900 µA Maximum current (peak) during the whole programming / erase operation -1.5 2.5 mA Table 37. Flash memory and data EEPROM endurance and retention Symbol Parameter Conditions Value Unit Min(1) 1. Guaranteed by characterization results. Typ Max NCYC(2) Cycling (erase / write) Program memory TA = -40°C to 105 °C 10 -- kcycles Cycling (erase / write) EEPROM data memory 300 -- tRET(2) 2. Characterization is done according to JEDEC JESD22-A117. Data retention (program memory) after 10 kcycles at TA = 85 °C TRET = +85 °C 30 - - years Data retention (EEPROM data memory) after 300 kcycles at TA = 85 °C 30 - - Data retention (program memory) after 10 kcycles at TA = 105 °C TRET = +105 °C 10 - - Data retention (EEPROM data memory) after 300 kcycles at TA = 105 °C 10 - - |
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