SN54ALS22B, SN74ALS22B

DUAL 4-INPUT POSITIVE-NAND GATES

WITH OPEN-COLLECTOR OUTPUTS

SDAS005A – MARCH 1984 – REVISED MAY 1986

POST OFFICE BOX 655303

Copyright

5BASIC

1

Outline Packages, Ceramic Chip Carriers,

and Standard Plastic and Ceramic 300-mil

DIPs

Reliability

description

These devices contain two independent 4-input

NAND gates. They perform the Boolean functions

Y = A

•B•C•D or Y = A+B+C+D in positive logic.

The

open-collector

outputs

require

pullup

resistors to perform correctly. They may be

connected to other open-collector outputs to

implement active-low wired-OR or active-high

wired-AND functions. Open-collector devices are

The SN54ALS22B is characterized for operation

over the full military temperature range of 55

°C

to 125

°C. The SN74ALS22B is characterized for

operation from 0

°C to 70°C.

FUNCTION TABLE

(each gate)

INPUTS

OUTPUT

A

B

C

D

Y

H

H

H

H

L

L

XXX

H

X

LX

X

H

X

XLX

H

X

X

X

L

H

2D

13

12

2C

&

8

2Y

6

1Y

2B

10

2A

9

1D

5

1C

4

2

1B

1A

1

† This symbol is in accordance with ANSI/IEEE Std 91-1984 and

IEC Publication 617-12.

Pin numbers shown are for D, J, and N packages.

1Y

1D

1A

1B

1C

2C

2B

2A

2D

2Y

logic diagram (positive logic)

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

NC

1C

1D

1Y

GND

2D

2C

NC

2B

2A

2Y

SN54ALS22B ...J PACKAGE

SN74ALS22B ...D OR N PACKAGE

(TOP VIEW)

3

2

1 20 19

910 11 12 13

4

5

6

7

8

18

17

16

15

14

2C

NC

NC

NC

2B

NC

NC

1C

NC

1D

SN54ALS22B . . . FK PACKAGE

(TOP VIEW)

NC – No internal connection

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.