| 数据搜索系统,热门电子元器件搜索 |
|
PI3USB9281GEE 数据表(PDF) 2 Page - Diodes Incorporated |
|
|
|||||||||||||||||||||||||||||
PI3USB9281GEE 数据表(HTML) 2 Page - Diodes Incorporated |
|
2 / 13 page ![]() ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||| 2014-04-0004 PT0502-1 04/28/14 2 PI3USB9281 USB 2.0 Port Protection with Charger Detection Pin Descriptions Name Type Default State Description USB Interface DPH Signal Path Open D+ signal switch path, dedicated USB port to be connected to the resident USB transceiver on the device DNH Signal Path Open D- signal switch path, dedicated USB port to be connected to the resident USB transceiver on the device Connector Interface ID Signal Path Open Connected to the USB connector ID pin and used for detecting accessories D+ Signal Path Open Connected to the USB connector D+ pin; depending on the signaling mode D- Signal Path Open Connected to the USB connector D- pin; depending on the signaling mode VBUSIN Power Path NA Input voltage supply pin to be connected to the VBUS pin of the USB connector Power Interface VBAT Power NA Input voltage supply pin to be connected to the device battery output or to an internal regulator VDDIO Power NA Baseband processor interface I/O supply pin ENB Input Hi-Z System enable for the circuit (Active Low) GND Power NA Ground Charger Interface VBUSOUT Power Path NA Output voltage supply pin to be connected to the source voltage pin on the charger IC CHG Open-Drain Output Hi-Z Open-drain active LOW output, used to signal the charger IC that a charger has been attached I 2C Interface SCL Input Hi-Z I 2C serial clock signal to be connected to the phone-based I2C master SDA Open-Drain I/O Hi-Z I 2C serial data signal to be connected to the phone-based I2C master INTB CMOS Output LOW Interrupt active LOW output used to prompt the phone baseband processor to read the I 2C register bits, indicates a change in ID pin status or accessory attach status Maximum Ratings StorageTemperature...................................................................................-65oC to +150oC Supply Voltage fromBattery/Baseband.....................................................-0.5V to +6.5V Supply Voltage fromMicro-USB Connector........................................-0.5V to +28.0V Switch I/O Voltage USB................................................................................-1.0V to +5.5V Input Clamp Diode current..............................................................................................50mA Charger Detect CHG Pin Sink current.........................................................................30mA Switch I/O Current (Continuous) USB.......................................................................50mA Switch I/O Switch Peak Current (Pulsed at 1ms Duration, <10% Duty Cycle) USB, and All Other Channels.....................................................................................150mA Charger FET.............................................................................................................................2A ESD: HBM .....................................................................................................................2000V HB M (USB connector pins: VBUSIN, D+, D+, ID to GND).................6000V Recommended operation conditions Symbol Parameter Min. Max. Units VBAT Battery Supply Voltage 3.0 5.5 V VBAT_TH Battery Supply Voltage Threshold - 3.0 V VBUSIN VBUSIN Pin Supply Voltage 4.0 5.5 V VDDIO Processor Supply Voltage 1.8 5.5 V VSW Switch I/O Voltage USB Path Active 0 3.6 V CID Capacitive Load on ID Pin for Reliable Accessory Detection 0 1.0 nF TA Operating Temperature -40 85 °C Note: Stresses greater than those listed under MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. |
|
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |