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ADR1399 数据表(PDF) 7 Page - Analog Devices

部件名 ADR1399
功能描述  Oven-Compensated, Buried Zener, 6.62 V Voltage Reference
PDF  10 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADR1399 数据表(HTML) 7 Page - Analog Devices

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Data Sheet
ADR1000
THEORY OF OPERATION
analog.com
Rev. B | 7 of 10
The ADR1000 consists of a buried Zener diode, a temperature
compensating transistor, a temperature sensing transistor, and a
heater resistor. The output reference voltage (VREF) is formed by
summing the buried Zener diode voltage (VBZ1) and a temperature
compensating transistor base emitter voltage (VBEQ1), where the
Zener diode temperature coefficient is approximately +2 mV/°C,
and the transistor VBE temperature coefficient is approximately
−2 mV/°C. Referring to Figure 9, an external op amp (U3), in
combination with an external resistor (R1), is used to set the Zener
operating current as follows:
R
1= 0.658 V − 0.0022 × TSET
Iz
 − 7 Ω
where:
TSET is the heated chip temperature.
IZ is the desired Zener current.
0.658 V is the Q1 VBE at 0°C.
7 Ω is the bulk resistance to the Zener anode.
With TSET = 70°C and Iz = 4 mA,
R
1= 0.658 V − 0.002 × 70
Iz
 − 7 Ω = 129.5 Ω
Note that because the 7 Ω bulk resistance (R0 in Figure 1) sche-
matically appears under the Q1 base, it must be included in the
calculation of Iz. The primary performance implication of the buried
Zener operating current is output voltage noise. The ADR1000 can
achieve a total output noise of 0.14 ppm (0.9 µV p-p) in the 0.1
to 10 Hz frequency band when IBZ1 = 5 mA and ICQ1 = 100 µA,
with the dominant noise source being the Zener diode. Increasing
the current in the Zener (IBZ1) reduces the reference noise by the
inverse square root of the Zener current. A Zener bias current
greater than 8 mA is not practical because power dissipation limits
maximum ambient temperature. The ADR1000 applications circuit
output noise spectral density has been measured over a range of
Zener set currents (see Figure 3). The ADR1000 long-term drift
(LTD) is characterized at a Zener current of IBZ1 = 5 mA and a Q1
current of ICQ1 = 100 µA, and results are shown in Figure 5.
SETTING THE OPERATING TEMPERATURE
The ADR1000 can regulate chip operating temperature to within
a few millidegrees over a 100°C ambient temperature change.
This means if the unheated reference temperature coefficient is
20 ppm/°C, then the theoretical heated temperature coefficient is
well below 0.1 ppm/°C. This performance is difficult to achieve in a
practical circuit (refer to the Avoiding Thermocouple Errors section
for more information). The VBE of Q2 is compared to a divided down
copy of the 6.62 V reference voltage (see Figure 9). The 13 kΩ:1
kΩ divider sets the VBE of the Q2 at around 474 mV. At room
temperature, a VBE of 474 mV does not provide enough collector
current to satisfy the condition that the input terminals of U2 must
be equal to within a few hundred microvolts. Thus, the noninverting
input of U2 is pulled up until its inputs clamp or until its noninverting
terminal hits VREF. The voltage difference between the two inputs
of U2 causes the output of U2 to pull up, increasing the amount of
power dissipated in the on-chip heater. Because the transistor base
emitter voltage has a negative temperature coefficient, the collector
current of Q2 increases as the chip temperature rises, causing the
op amp inputs to move closer together until the voltage drop across
R3 satisfies the loop. The temperature at which the thermal loop is
satisfied is the chip set temperature (TSET).
Figure 7 shows the ADR1000 and LTZ1000A total supply current
vs. the ambient temperature. Notice that the heater current has a
square root dependence on the difference between the ambient
temperature and the set temperature because the power dissipated
in the heater is proportional to the square of the current. When
the ambient temperature reaches the set temperature, the current
in the heater goes to zero, and the chip temperature is no longer
regulated.
THERMAL RESISTANCE
The ADR1000 uses a specialized epoxy die attachment to maxi-
mize the thermal isolation that reduces the power consumption
required to achieve a given set temperature. At an ambient temper-
ature of 10°C, the heater power consumption is approximately 35
mA2 × 242 Ω = 300 mW, assuming that the heater supply current is
the total supply current minus 5 mA for the Zener current and other
components on the PCB (see Figure 7). For 300 mW dissipation in
the heater, the internal temperature of the ADR1000 is elevated by
65°C, yielding a 216°C/W junction to ambient thermal impedance
JA).
Table 6. Recommended Values for Varying the Set Temperature in 5° Increments
Estimate Set Temperature (°C)
R4 (Ω)
R5 (kΩ)
VBEQ2 (mV)
80
13 k + 316
1
464
75
13 k
1
474
70
13 k − 316
1
484
65
13 k − 632
1
494



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