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LPC2102 数据表(PDF) 8 Page - NXP Semiconductors |
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LPC2102 数据表(HTML) 8 Page - NXP Semiconductors |
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8 / 32 page ![]() LPC2101_02_03_1 © Koninklijke Philips Electronics N.V. 2006. All rights reserved. Preliminary data sheet Rev. 01 — 18 January 2006 8 of 32 Philips Semiconductors LPC2101/2102/2103 Single-chip 16-bit/32-bit microcontrollers P0.21/SSEL1/ MAT3.0 3 [4] 9 [4] I/O P0.21 — General purpose Input/output digital pin (GPIO). I SSEL1 — Slave Select for SPI1. Selects the SPI interface as a slave. O MAT3.0 — PWM output for Timer 3, channel 0. P0.22/AD0.0 32 [4] 35 [4] I/O P0.22 — General purpose Input/output digital pin (GPIO). I AD0.0 — ADC 0, input 0. P0.23/AD0.1 33 [1] 36 [1] I/O P0.23 — General purpose Input/output digital pin (GPIO). I AD0.1 — ADC 0, input 1. P0.24/AD0.2 34 [1] 37 [1] I/O P0.24 — General purpose Input/output digital pin (GPIO). I AD0.2 — ADC 0, input 2. P0.25/AD0.6 38 [1] 41 [1] I/O P0.25 — General purpose Input/output digital pin (GPIO). I AD0.6 — ADC 0, input 6. P0.26/AD0.7 39 [1] n.c. I/O P0.26 — General purpose Input/output digital pin (GPIO). I AD0.7 — ADC 0, input 7. P0.27/TRST/ CAP2.0 8 [4] 13 [4] I/O P0.27 — General purpose Input/output digital pin (GPIO). I TRST — Test Reset for JTAG interface. I CAP2.0 — Capture input for Timer 2, channel 0. P0.28/TMS/ CAP2.1 9 [4] 14 [4] I/O P0.28 — General purpose Input/output digital pin (GPIO). I TMS — Test Mode Select for JTAG interface. I CAP2.1 — Capture input for Timer 2, channel 1. P0.29/TCK/ CAP2.2 10 [4] 15 [4] I/O P0.29 — General purpose Input/output digital pin (GPIO). I TCK — Test Clock for JTAG interface. I CAP2.2 — Capture input for Timer 2, channel 2. P0.30/TDI/ MAT3.3 15 [4] 20 [4] I/O P0.30 — General purpose Input/output digital pin (GPIO). I TDI — Test Data In for JTAG interface. O MAT3.3 — PWM output 3 for Timer 3. P0.31/TDO 16 [4] 21 [4] O P0.31 — General purpose output only digital pin (GPIO). O TDO — Test Data Out for JTAG interface. RTXC1 20 [5] 24 [5] I Input to the RTC oscillator circuit. RTXC2 25 [5] 29 [5] O Output from the RTC oscillator circuit. RTCK 26 [5] n.c. I/O Returned test clock output: Extra signal added to the JTAG port. Assists debugger synchronization when processor frequency varies. Bidirectional pin with internal pull-up. X1 11 16 I Input to the oscillator circuit and internal clock generator circuits. X2 12 17 O Output from the oscillator amplifier. DBGSEL 27 30 I Debug select: When LOW, the part operates normally. When HIGH, debug mode is entered. Input with internal pull-down. RST 6 11 I External reset input: A LOW on this pin resets the device, causing I/O ports and peripherals to take on their default states and processor execution to begin at address 0. TTL with hysteresis, 5 V tolerant. VSS 7, 19, 43 1, 12, 23 I Ground: 0 V reference. Table 3: Pin description …continued Symbol LQFP48 PLCC44 Type Description |
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