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FODM1007 数据表(PDF) 2 Page - ON Semiconductor |
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FODM1007 数据表(HTML) 2 Page - ON Semiconductor |
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2 / 9 page ![]() FODM100x Series www.onsemi.com 2 SAFETY AND INSULATION RATINGS (As per DIN EN/IEC 60747−5−5, this optocoupler is suitable for “safe electrical insulation” only within the safety limit data. Compliance with the safety ratings shall be ensured by means of protective circuits.) Parameter Characteristics Installation Classifications per DIN VDE 0110/1.89 Table 1, For Rated Mains Voltage <150 VRMS I–IV <300 VRMS I–III Climatic Classification 40/110/21 Pollution Degree (DIN VDE 0110/1.89) 2 Comparative Tracking Index 175 Symbol Parameter Value Unit VPR Input−to−Output Test Voltage, Method A, VIORM x 1.6 = VPR, Type and Sample Test with tm = 10 s, Partial Discharge < 5 pC 1,426 Vpeak Input−to−Output Test Voltage, Method B, VIORM x 1.875 = VPR, 100% Production Test with tm = 1 s, Partial Discharge < 5 pC 1,671 Vpeak VIORM Maximum Working Insulation Voltage 890 Vpeak VIOTM Highest Allowable Over−Voltage 6.000 Vpeak External Creepage ≥8.0 mm External Clearance ≥8.0 mm DTI Distance Through Insulation (Insulation Thickness) ≥0.4 mm TS Case Temperature (Note 1) 150 °C IS,INPUT Input Current (Note 1) 200 mA PS,OUTPUT Output Power (Note 1) 300 mW RIO Insulation Resistance at TS, VIO = 500 V (Note 1) >109 W 1. Safety limit values – maximum values allowed in the event of a failure. ABSOLUTE MAXIMUM RATINGS (TA = 25°C, unless otherwise noted) Symbol Parameter Value Unit TOTAL PACKAGE TSTG Storage Temperature −55 to +150 °C TOPR Operating Temperature −40 to +110 °C TJ Junction Temperature −40 to +125 °C EMITTER IF(avg) Continuous Forward Current 50 mA IF(pk) Continuous Forward Current (1 ms Pulse, 300 pps) 1 A VR Reverse Input Voltage 6 V PDLED LED Power Dissipation @ TA = 25°C (Note 2) 100 mW Derate Above 25°C 0.9 mW/°C DETECTOR IC Continuous Collector Current 50 mA VCEO Collector−Emitter Voltage 70 V VECO Emitter−Collector Voltage 7 V PDC Detector Power Dissipation @ TA = 25°C (Note 2) 150 mW Derate Above 25°C 1.47 mW/°C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 2. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected to conditions outside these ratings. |
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