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STPS80A45CSG 数据表(PDF) 3 Page - STMicroelectronics |
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STPS80A45CSG 数据表(HTML) 3 Page - STMicroelectronics |
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3 / 10 page ![]() 1.3 Electrical characteristics Limiting value per diodes, unless otherwise specified. Table 3. Static electrical characteristics Symbol Parameter MIL-STD-750 test method Test conditions(1) Min. Typ. Max. Unit IR Reverse leakage current 4016 DC method, VR = 45 V Tj = 25 °C - 4.0 25 µA Tj = 125 °C - 6.0 18 mA VF (2) Forward voltage drop 4011 IF = 5 A Tj = -55 °C - 0.55 0.59 V Tj = 25 °C - 0.47 0.51 Tj = 125 °C - 0.36 0.40 IF = 10 A Tj = -55 °C - 0.59 0.63 Tj = 25 °C - 0.53 0.57 Tj = 125 °C - 0.44 0.49 IF = 20 A Tj = -55 °C - 0.65 0.70 Tj = 25 °C - 0.62 0.67 Tj = 125 °C - 0.55 0.61 IF = 30 A Tj = -55 °C - 0.71 0.76 Tj = 25 °C - 0.69 0.75 Tj = 125 °C - 0.62 0.68 IF = 40 A Tj = -55 °C - 0.76 0.82 Tj = 25 °C - 0.76 0.82 Tj = 125 °C - 0.67 0.74 1. Measurement per diode 2. Pulse width 680 µs, duty cycle ≤ 2% Table 4. Dynamic electrical characteristics Symbol Parameter Mil-STD-750 test method Test conditions Min. Typ. Max. Unit C(1) Junction capacitance 4001 Tj = 25 °C VR = 10 V, F = 1 MHz - - 610 pF 1. Guaranteed by sampling. In case the sampling acceptance criteria is not met, guaranteed by a 100% test STPS80A45CHR Electrical characteristics DS13146 - Rev 2 page 3/10 |
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