Rev Date: 5/20/2022

3

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CSRT_-AS Series

Anti-sulfur Metal Film Low Resistance Chip Resistor

Stackpole Electronics, Inc.

Resistive Product Solutions

Power Derating Curve:

Performance Characteristics (cont.)

Test Item

Test Method

Test Condition

Test Limits

Rapid Change of

Temperature

JIS C-5201-1 4.19

IEC-60115-1 4.19

-55°C to +155°C, 300 cycles

± (1% + 0.001Ω)

No visual damage

Damp Heat with Load

JIS C-5201-1 4.24

IEC-60115-1 4.24

40ºC ± 2°C, 90 ~ 95% R.H., RCWV or max. working current

whichever is less for 1000 hours with 1.5 hours "ON"

and 0.5 hours "OFF"

± (1% + 0.001Ω)

Biased Humidity

MIL-STD-202

Method 103

1000 hours; 85°C/85% RH, 10% of operating power. Measurement

at 24 ± 4 hours after test conclusion.

± (0.5% + 0.05Ω)

Load Life (Endurance)

JIS C-5201-1 4.25

IEC-60115-1 4.25.1

70ºC ± 2°C, rated power or max. working current whichever is less

for 1000 hours with 1.5 hours "ON" and 0.5 hours "OFF"

± (1% + 0.001Ω)

High Temperature

Exposure

JIS C-5201-1 4.23.2

IEC 60068-2-2

At 155 ± 5°C for 1000 + 48/-0 hours.

± (1% + 0.001Ω)

Resistance to Solvent

JIS C-5201-1

clause 4.29

The tested resistor be immersed into isopropyl alcohol of

20°C ~ 25°C for 60 seconds.

Then the resistor is left in room for 48 hours

± (1% + 0.001Ω)

No visual damage

Terminal Strength

JIS C-5201-1 4.32

AEC Q200-006

Pressurizing force for 10 seconds.

0402, 0603: 8 N; 0805 and above: 17.7N

No breakage

Bending Strength

JIS C-5201-1 4.33

IEC-60115-1 4.33

Bending once for 5 seconds.

D: 0402, 0603, 0805 = 5 mm

1206, 1210 = 3 mm

2010, 2512 = 2 mm

± (1% + 0.001Ω)

No visual damage

ASTM B809-95

ANSI/EIA-977

AEC-Q200 test reports are availble on request. Contact Stackpole.

Temperature Coefficient of Resistance test to -55°C is available on request.

Sulfur Test

(FoS)

105 ± 2°C, no power rating for 750 hours

± (2% + 0.001Ω)