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STP65N045M9 数据表(PDF) 4 Page - STMicroelectronics |
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STP65N045M9 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 12 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD(1) Source-drain current - 55 A ISDM(2) Source-drain current (pulsed) - 170 A VSD(3) Forward on voltage ISD = 55 A, VGS = 0 V - 1.5 V trr Reverse recovery time ISD = 55 A, di/dt = 100 A/µs, VDD = 100 V (see Figure 16. Test circuit for inductive load switching and diode recovery times) - 288 ns Qrr Reverse recovery charge - 4 µC IRRM Reverse recovery current - 26 A trr Reverse recovery time ISD = 55 A, di/dt = 100 A/µs, VDD = 100 V, TJ = 150 °C (see Figure 16. Test circuit for inductive load switching and diode recovery times) - 400 ns Qrr Reverse recovery charge - 7.5 µC IRRM Reverse recovery current - 34 A 1. Limited by maximum junction temperature. 2. Pulse width is limited by safe operating area. 3. Pulsed: pulse duration = 300 µs, duty cycle 1.5%. STP65N045M9 Electrical characteristics DS13506 - Rev 4 page 4/12 |
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