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DF2S6M4FS 数据表(PDF) 4 Page - Toshiba Semiconductor

部件名 DF2S6M4FS
功能描述  ESD Protection Diodes Silicon Epitaxial Planar
PDF  9 Pages
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制造商  TOSHIBA [Toshiba Semiconductor]
网页  http://www.semicon.toshiba.co.jp/eng
标志 TOSHIBA - Toshiba Semiconductor

DF2S6M4FS 数据表(HTML) 4 Page - Toshiba Semiconductor

  DF2S6M4FS Datasheet HTML 1Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 2Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 3Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 4Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 5Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 6Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 7Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 8Page - Toshiba Semiconductor DF2S6M4FS Datasheet HTML 9Page - Toshiba Semiconductor  
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DF2S6M4FS
4
7.
7.
7.
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25 
))))
Characteristics
Electrostatic discharge voltage (IEC61000-4-2) (Contact)
Electrostatic discharge voltage (IEC61000-4-2) (Air)
Electrostatic discharge voltage (ISO10605) (Contact)
Electrostatic discharge voltage (ISO10605) (Air)
Peak pulse power
Peak pulse current
Junction temperature
Storage temperature
Symbol
VESD
PPK
IPP
Tj
Tstg
Note
(Note 1)
(Note 2)
(Note 3)
Rating
±20
±30
30
2
150
-55 to 150
Unit
kV
kV
W
A
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: According to IEC61000-4-2.
Note 2: According to ISO10605.
Note 3: According to IEC61000-4-5.
2019-11-01
Rev.2.0
©2019
Toshiba Electronic Devices & Storage Corporation



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