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BL-3014W10-R80 数据表(PDF) 7 Page - American Bright OPTOELECTRONICS CORP. |
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BL-3014W10-R80 数据表(HTML) 7 Page - American Bright OPTOELECTRONICS CORP. |
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7 / 11 page ![]() B BR RIIG GH HT T L LE ED D E EL LE EC CT TR RO ON NIIC CS S C CO OR RP P.. Ver1.0 Page: 8 of 12 SI N CE 198 1 ● Reliability Test Test Item Test Conditions Test Hours/ Cycles Result Steady State Operating Life of High Temperature IF=20mA Ta=60℃ 1,000hrs 0/20 Steady State Operating Life IF=20mA Ta=25℃ 3,000hrs 0/20 Steady State Operating Life Low Temperature Condition1 IF=20mA Ta=-30℃ 1,000hrs 0/20 Steady State Operating Life Of High Humidity Heat IF=20mA Ta=60℃ RH=75% 1,000hrs 0/20 Thermal shock -45 ~ ℃ +125℃ 30 min 30 min 100cycle 0/20 Temperature &Humidity Cycling Ta=25℃ ~ +65 ~ ℃ -10℃ RH=90%RH,24hr/1cycle 1cycle 0/20 Resistance to Soldering Heat Tsld=260℃,10sec(Pre treatment30℃,70%,168hrs) 2times 0/20 ESD(HBM) -R1:10 K Ω,R2:1.5 KΩ,C:100 pF Discharge Time:3 times Min.2KV 0/5 ● Judgment criteria of failure for the reliability Note: 1. U means the upper limit of specified characteristics. S means initial value. 2. After each test, remove test pieces, wait for 2 hours and test pieces have returned to ambient temperature, then take next measurement. Measuring items Symbol Measuring conditions Judgment criteria for failure Forward voltage VF (V) IF=20mA Over U 1x1.2 Reverse current IR (uA) VR=5V Over U 1x2 Luminous intensity Iv ( mcd ) IF=20mA Below S 1X0.5 |
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