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TLE4971 数据表(PDF) 4 Page - Infineon Technologies AG |
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TLE4971 数据表(HTML) 4 Page - Infineon Technologies AG |
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4 / 23 page ![]() Datasheet 4 Revision 1.02 19-08-2022 TLE4971 Datasheet Absolute Maximum Ratings Table 2 Absolute Maximum Ratings General conditions (unless otherwise specified): VDD = 3.3V; TS = -40°C … +125°C Parameter Symbol Min Typ Max Unit Note / Test Condition Supply voltage VDD -0.3 3.3 3.6 V - - 6.5 V duration < 1 minute Primary nominal rated current LF1) IPNRLF -70 - 70 A Peak, frequency < 10Hz. Tested on Infinenon reference PCB (see related application note: AppNote TLx4971 PCB) Primary nominal rated current HF2) IPNRHF -70 - 70 A RMS, frequency ≥ 10Hz. Tested on Infinenon reference PCB (see related application note: AppNote TLx4971 PCB) Primary current IPNS -250 - 250 A Single peak for 10µs, 10 assertions per lifetime Voltage on interface pins VREF, OCD1, AOUT VIO -0.3 - VDD + 0.3 V Voltage on Interface pin OCD2 VIO_OCD2 -0.3 - 21 V ESD voltage3) VESD_HBM -2 - 2 kV ESD voltage4) VESD_SYS -16 - 16 kV In the application circuit Voltage slew-rate on current rail ΔV/dt - - 10 V/ns Maximum junction temperature Tj_max - - 130 °C Storage temperature TA_STORE -40 - 150 °C Life time LT 15 - - Years Considering continuous operation with TS = 70°C and I = 30 A RMS 1) Tested with primary nominal rated current of 70A peak on Infineon reference PCB at Low Frequency (LF). Thermal equilibrium reached after 2 min. 2) Tested with primary nominal rated current of 70A rms on Infineon reference PCB at High Frequency (HF). Thermal equilibrium reached after 2 min. 3) Human Body Model (HBM), according to standard AEC-Q 100-002 4) According to standard IEC 61000−4−2 electrostatic discharge immunity test Stress above the limit values listed here may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Maximum ratings are absolute ratings. Exceeding only one of these values may cause irreversible damage to the integrated circuit. |
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