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MCP6L71RT-E/MS 数据表(PDF) 5 Page - Microchip Technology |
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MCP6L71RT-E/MS 数据表(HTML) 5 Page - Microchip Technology |
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5 / 40 page ![]() 2009-2019 Microchip Technology Inc. DS20002145B-page 5 MCP6L71/1R/2/4 1.3 Test Circuits The circuit used for most DC and AC tests is shown in Figure 1-1. This circuit can independently set VCM and VOUT; see Equation 1-1. Note that VCM is not the circuit’s Common-mode voltage ((VP + VM)/2), and that VOST includes VOS plus the effects (on the input offset error, VOST) of temperature, CMRR, PSRR and AOL. EQUATION 1-1: FIGURE 1-1: AC and DC Test Circuit for Most Specifications. GDM RF RG = VCM VP VDD 2 + 2 = VOUT VDD 2 VP VM – V OST 1 GDM + ++ = Where: GDM = Differential-mode Gain (V/V) VCM = Op Amp’s Common-mode Input Voltage (V) VOST = Op Amp’s Total Input Offset Voltage (mV) VOST VIN– VIN+ – = VDD MCP6L7X RG RF VOUT VM CB2 CL RL VL CB1 100 k 100 k RG RF VDD/2 VP 100 k 100 k 60 pF 10 k 1µF 100 nF VIN- VIN+ CF 6.8 pF CF 6.8 pF + – |
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