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F3NK80Z 数据表(PDF) 4 Page - STMicroelectronics

部件名 F3NK80Z
功能描述  N-channel 800 V, 3.8 Ω typ., 2.5 A SuperMESH™ Power MOSFETs in IPAK, DPAK, TO-220FP, TO-220 packages
PDF  29 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

F3NK80Z 数据表(HTML) 4 Page - STMicroelectronics

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Electrical characteristics
STD3NK80Z-1, STD3NK80ZT4, STF3NK80Z,
STP3NK80Z
4/29
DocID9565 Rev 7
2
Electrical characteristics
(TC = 25 °C unless otherwise specified)
Table 5: On /off states
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
V(BR)DSS
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
800
V
IDSS
Zero gate voltage drain
current
VGS = 0 V, VDS = 800 V
1
µA
VGS = 0 V, VDS = 800 V,
TC = 125 °C(1)
50
µA
IGSS
Gate-body leakage current
VDS = 0 V, VGS = ±20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 50 µA
3
3.75
4.5
V
RDS(on)
Static drain-source
on- resistance
VGS = 10 V, ID = 1.25 A
3.8
4.5
Notes:
(1)Defined by design, not subject to production test.
Table 6: Dynamic
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Ciss
Input capacitance
VGS = 0 V, VDS = 25 V,
f = 1 MHz
-
485
-
pF
Coss
Output capacitance
-
57
-
pF
Crss
Reverse transfer capacitance
-
11
-
pF
Coss eq(1)
Equivalent output capacitance
VGS = 0 V, VDS = 0 to 640 V
-
22
-
pF
Qg
Total gate charge
VDD = 640 V, ID = 2.5 A,
VGS = 0 to 10 V
(see Figure 17: "Test circuit
for gate charge behavior")
-
19
-
nC
Qgs
Gate-source charge
-
3.2
-
nC
Qgd
Gate-drain charge
-
10.8
-
nC
Notes:
(1)Coss eq is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80%
Table 7: Switching times
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
td(on)
Turn-on delay time
VDD = 400 V, ID = 1.25 A, RG = 4.7
Ω, VGS =10 V
(see Figure 16: "Test circuit for
resistive load switching times" and
Figure 21: "Switching time
waveform")
-
17
-
ns
tr
Rise time
-
27
-
ns
td(off)
Turn-off delay time
-
36
-
ns
tf
Fall time
-
40
-
ns



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