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STP5NK60Z 数据表(PDF) 3 Page - STMicroelectronics |
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STP5NK60Z 数据表(HTML) 3 Page - STMicroelectronics |
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3 / 24 page ![]() 2 Electrical characteristics (TCASE = 25 °C unless otherwise specified) Table 4. On/off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage ID = 1 mA, VGS = 0 V 600 V IDSS Zero gate voltage drain current VGS = 0 V, VDS = 600 V 1 µA VGS = 0 V, VDS = 600 V, TC = 125 °C (1) 50 µA IGSS Gate body leakage current VDS = 0 V, VGS = ±20 V ±10 µA VGS(th) Gate threshold voltage VDS = VGS, ID = 50 µA 3 3.75 4.5 V RDS(on) Static drain-source on resistance VGS = 10 V, ID = 2.5 A 1.2 1.6 Ω 1. Defined by design, not subject to production test. Table 5. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit Ciss Input capacitance VDS = 25 V, f = 1 MHz, VGS = 0 V - 690 pF Coss Output capacitance 90 Crss Reverse transfer capacitance 20 Coss eq. (1) Equivalent output capacitance VDS = 0 to 480 V, VGS = 0 V - 40 pF Qg Total gate charge VDD = 400 V, ID = 5 A, VGS = 0 to 10 V (see Figure 16. Test circuit for gate charge behavior) - 26 34 nC Qgs Gate-source charge 6 Qgd Gate-drain charge 14 1. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS. Table 6. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 300 V, ID = 2.5 A, RG = 4.7 Ω, VGS = 10 V (see Figure 15. Test circuit for resistive load switching times and Figure 20. Switching time waveform) - 16 - ns tr Rise time 25 td(off) Turn-off delay time 36 tr Fall time 25 tr(Voff) Off-voltage rise time VDD = 480 V, ID = 5 A, RG = 4.7 Ω, VGS = 10 V (see Figure 17. Test circuit for inductive load switching and diode recovery times and Figure 20. Switching time waveform) 12 tf Fall time 10 tc Cross-over time 24 STD5NK60ZT4, STP5NK60Z, STP5NK60ZFP Electrical characteristics DS2857 - Rev 8 page 3/24 |
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