HCS04MS

FN3046 Rev 1.00

Page 5 of 8

August 1995

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4 (Note 1)

NOTE:

1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OPEN

GROUND

1/2 VCC = 3V

 0.5V

VCC = 6V

 0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I TEST CONDITIONS (Note 1)

2, 4, 6, 8, 10, 12

1, 3, 5, 7, 9, 11, 13

-

14

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

2, 4, 6, 8, 10, 12

7

-

1, 3, 5, 9, 11, 13, 14

-

-

DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)

-

7

2, 4, 6, 8, 10, 12

14

1, 3, 5, 9, 11, 13

-

NOTES:

1. Each pin except VCC and GND will have a resistor of 10K

  5% for static burn-in.

2. Each pin except VCC and GND will have a resistor of 1K

  5% for dynamic burn-in.

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

 0.5V

2, 4, 6, 8, 10, 12

7

1, 3, 5, 9, 11, 13, 14

NOTE: Each pin except VCC and GND will have a resistor of 47K

  5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.