HCS11MS

FN3048 Rev 0.00

Page 5 of 7

November 1994

6, 8, 12

1, 2, 3, 4, 5, 7, 9, 10, 11,

13

-14

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 1)

6, 8, 12

7

-

1, 2, 3, 4, 5, 9, 10,

11, 13, 14

--

DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)

-

7

6, 8, 12

14

1, 2, 3, 4, 5, 9,

10, 11, 13

-

NOTES:

1. Each pin except VCC and GND will have a resistor of 10K

  5% for static burn-in.

2. Each pin except VCC and GND will have a resistor of 680K

  5% for dynamic burn-in.

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V

 0.5V

6, 8, 12

7

1, 2, 3, 4, 5, 9, 10, 11, 13, 14

NOTE: Each pin except VCC and GND will have a resistor of 47K

  5% for irradiation testing.

Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.

TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OPEN

GROUND

1/2 VCC = 3V

 0.5V

VCC = 6V

 0.5V

OSCILLATOR

50kHz

25kHz

AC Timing Diagrams

AC VOLTAGE LEVELS

PARAMETER

HCS

UNITS

VCC

4.50

V

VIH

4.50

V

VS

2.25

V

VIL

0

V

GND

0

V

VS

INPUT

OUTPUT

OUTPUT

TTHL

80%

20%

80%

20%

VIH

VIL

VOH

VOL

VOH

VOL

TPLH

TPHL

VS

TTLH

AC Load Circuit

DUT

TEST

CL

RL

POINT

CL = 50pF

RL = 500

