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AS2333 数据表(PDF) 4 Page - Diodes Incorporated |
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AS2333 数据表(HTML) 4 Page - Diodes Incorporated |
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4 / 16 page ![]() AS2333 Document number: DS42770 Rev. 3 - 2 4 of 16 www.diodes.com January 2021 © Diodes Incorporated AS2333 Electrical Characteristics (@ TA = +25°C, VS= 5.0V, RL = 10kΩ connected to VS/ 2, VCM= VS / 2, and VOUT= VS / 2, unless otherwise specified.) Symbol Parameter Conditions Min Typ Max Unit Offset Voltage VOS Input Offset Voltage VS = 5V — 8 22 μV ∆VOS/∆T Input Offset Voltage Drift (Note 7) TA = -40°C to +85°C — 0.02 0.1 μV/°C TA = -40°C to +125°C — — 0.2 μV/°C PSRR Power-Supply Rejection Ratio VS = 1.8V to 5.5V, TA = -40°C to +125°C — 1 5 μV/V — Long-Term Stability — (Note 7) μV — Channel Separation, DC — — 0.1 — μV/V Input Bias Current IB Input Bias Current TA = +25°C — ±70 ±200 pA TA = -40°C to +125°C — ±400 — IOS Input Offset Current — — ±140 ±400 Noise VN Input Voltage Noise f = 0.01Hz to 1Hz — 0.3 — μVPP f = 0.1Hz to 10Hz — 1.1 — IN Input Current Noise f = 10Hz — 100 — fA/√Hz Input Voltage VCM Common-Mode Voltage Range — (V-) - 0.1 — (V+) + 0.1 V CMRR Common-Mode Rejection Ratio (V-) - 0.1V < VCM < (V+) + 0.1V, TA = -40°C to +125°C 106 120 — dB Input Capacitance — Differential — — 2 — pF — Common-Mode — — 4 — pF Open-Loop Gain AOL Open-Loop Voltage Gain (V-) + 100mV < VO < (V+) - 100mV, RL = 10kΩ, TA = -40°C to +125°C 106 130 — dB Frequency Response GBW Gain-Bandwidth Product CL = 100pF — 350 — kHz SR Slew Rate G = +1 — 0.12 — V/μs Output — Voltage Output Swing from Rail Positive Rail RL = 10kΩ TA = +25°C — 30 50 mV TA = -40°C to +125°C — — 70 Negative Rail RL = 10kΩ TA = +25°C — 10 50 TA = -40°C to +125°C — — 70 ISC Short-Circuit Current Source Current — 5 — mA Sink Current — 25 — mA — Open-Loop Output Impedance f = 350kHz, IO = 0A — 2 — kΩ Power Supply VS Specified Voltage Range — 1.8 — 5.5 V IQ Quiescent Current per Amplifier IO = 0A, TA = +25°C — 12 20 μA IO = 0A, TA = -40°C to +125°C — — 28 tON Turn-On Time VS = 5V — 100 — μs Note: 7. 300-hour life test at +150°C demonstrated randomly distributed variation of approximately 1μV. This parameter guaranteed by design and characterization, not by testing. |
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