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IP431AM 数据表(PDF) 3 Page - Seme LAB |
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IP431AM 数据表(HTML) 3 Page - Seme LAB |
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3 / 7 page  IP431A Series Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612. Prelim. 2/95 IP431AI Parameter Test Conditions Min. Typ. Max. Units VKA = VREF IK = 10mA TA = -40 to +85°C * VKA = VREF IK = 10mA TA = -40 to +85°C * IK = 10mA R1 = 10k Ω R2 = ∞ IK = 10mA TA = -40 to +85°C * R1 = 10k Ω R2 = ∞ IK = 10mA TA = -40 to +85°C * VKA = VREF VKA = 36V VREF = 0 VKA = VREF f ≤ 1kHz ∆I K = 1mA to 100mA ∆V KA = 10V to VREF ∆V KA = 36V to 10V VREF ∆V REF ∆V REF ∆V KA IREF ∆I REF IMIN IOFF |Zka| Reference Input Voltage (Figure 1) Reference Input Voltage Over Temperature Range 1 (Figure 1) Ratio of Reference Voltage Change to Change in Cathode to Anode Voltage (Figure 2) Reference Input Current (Figure 2) Reference Input Current Deviation Over Temperature Range (Figure 2) Minimum Cathode Current For Regulation (Figure 1) Off–State Cathode Current (Figure 3) Dynamic Impedance 2 (Figure 1) V mV mV/V µA µA mA nA Ω 2.47 2.495 2.52 2.44 2.55 730 14 6.5 0.8 2.5 0.5 1 3 1000 0.2 0.5 -1.5 -2.7 -0.7 -2 IP431AC Parameter Test Conditions Min. Typ. Max. Units VKA = VREF IK = 10mA TA = 0 to +70°C * VKA = VREF IK = 10mA TA = 0 to +70°C * IK = 10mA R1 = 10k Ω R2 = ∞ IK = 10mA TA = 0 to +70°C * R1 = 10k Ω R2 = ∞ IK = 10mA TA = 0 to +70°C * VKA = VREF VKA = 36V VREF = 0 VKA = VREF f ≤ 1kHz ∆I K = 1mA to 100mA ∆V KA = 10V to VREF ∆V KA = 36V to 10V VREF ∆V REF ∆V REF ∆V KA IREF ∆I REF IMIN IOFF |Zka| Reference Input Voltage (Figure 1) Reference Input Voltage Over Temperature Range 1 (Figure 1) Ratio of Reference Voltage Change to Change in Cathode to Anode Voltage (Figure 2) Reference Input Current (Figure 2) Reference Input Current Deviation Over Temperature Range (Figure 2) Minimum Cathode Current For Regulation (Figure 1) Off–State Cathode Current (Figure 3) Dynamic Impedance 2 (Figure 1) V mV mV/V µA µA mA nA Ω 2.47 2.495 2.52 2.453 2.537 317 14 5.2 0.4 1.2 0.5 1 3 1000 0.2 0.5 -1.5 -2.7 -0.7 -2 ELECTRICAL CHARACTERISTICS (TA = 25 °C unless otherwise stated) * This test is not applicable to surface mount (D Package) devices. |
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