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IP431AI 数据表(PDF) 4 Page - Seme LAB |
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IP431AI 数据表(HTML) 4 Page - Seme LAB |
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4 / 7 page ![]() IP431A Series Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612. Prelim. 2/95 FIGURE 2 TEST CIRCUIT FOR VKA > VREF FIGURE 3 TEST CIRCUIT FOR Ioff FIGURE 1 TEST CIRCUIT FOR VKA = VREF R1 |Zka| ≈ |Zka| 1+ R2 NOTE 1 The deviation parameter ∆V REF is defined as the differences between the maximum and minimum values obtained over the full operating ambient temperature range that applies. The average temperature coefficient of the reference input voltage, ∝V REF is defined as: ∝V REF can be positive or negative depending on whether ∝VREF Min or ∝V REF Max occurs at the lower ambient temperature. REF VMin REF V Max T1 T2 AMBIENT TEMPERATURE ∆V REF ( ) x 106 ppm VREF @ 25°C ∝V REF = = °C ∆T A ∆V REF x 10 6 = ∆T A (VREF @ 25°C) Example: ∆V REF = 8.0 mV and slope is positive, VREF @ 25°C = 2.495V, ∆TA = 70°C 0.008 x 106 = 45.8 ppm/°C ∝V REF = = 45.8 ppm/°C 70 (2.495) NOTE 2 The dynamic impedance Zka is defined as: ∆V KA |Zka| = ∆I K When the device is programmed with two external resistors, R1 and R2, (refer to Figure 2) the total dynamic impedance of the circuit is defined as: ( ) REF I KA V Input K I REF V KA V Input off I KA V Input K I REF V ∆V REF =VREF Max - VREF Min ∆T A = T2 - T1 R1 VKA = VREF 1+ + IREF x R1 R2 ( ) |
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