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74LVC2GU04GS 数据表(PDF) 6 Page - Nexperia B.V. All rights reserved |
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74LVC2GU04GS 数据表(HTML) 6 Page - Nexperia B.V. All rights reserved |
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6 / 15 page ![]() Nexperia 74LVC2GU04 Dual unbuffered inverter VEXT VCC VI VO mna616 DUT CL RT RL RL G Test data is given in Table 10. Definitions for test circuit: RL = Load resistance; CL = Load capacitance including jig and probe capacitance; RT = Termination resistance should be equal to the output impedance Zo of the pulse generator; VEXT = External voltage for measuring switching times. Fig. 8. Test circuit for measuring switching times Table 10. Test data Supply voltage Input Load VEXT VCC VI tr = tf CL RL tPLH, tPHL 1.65 V to 1.95 V VCC ≤ 2.0 ns 30 pF 1 kΩ open 2.3 V to 2.7 V VCC ≤ 2.0 ns 30 pF 500 Ω open 2.7 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 3.0 V to 3.6 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 4.5 V to 5.5 V VCC ≤ 2.5 ns 50 pF 500 Ω open 0 2 1 3 5 6 VCC (V) 160 120 40 0 80 4 gfs (mA/V) mnb108 Tamb = 25 °C. Fig. 9. Typical forward transconductance as a function of supply voltage mna638 VCC Rbias = 560 kΩ input 0.47 µF 100 µF output A IO VI fi = 1 kHz. VO is constant. Fig. 10. Test set-up for measuring forward transconductance 74LVC2GU04 All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2022. All rights reserved Product data sheet Rev. 13 — 20 January 2022 6 / 15 |
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