SLE 4432

SLE 4442

SLE 4440

SLE 4441

Semiconductor Group

13

Data Sheet Extension 09.98

4.

Electrical Characteristics

The listed characteristics are ensured over the operating range of the integrated circuit. Typical

characteristics specify mean values expected over the production spread. If not otherwise

specified, typical characteristics apply at T

4.1.

Absolute Maximum Ratings

Stresses above those listed may cause permanent damage to the device. This is a stress rating

only and functional operation of the device at these or any other conditions above those indicated

in the operational sections of this data sheet is not implied. Exposure to absolute maximum rating

conditions for extended periods may effect device reliability, including EEPROM data retention

and write/erase endurance.

Parameter

Symbol

Limit Values

Unit

Test Condition

min.

typ.

max.

ESD protection

V

S

1500 4000

V

ISO/IEC 7816-1

(write/erase cycles/bit)

10

5

—

10

years —

1) Values are temperature dependent, for further information please refer to your Siemens Sales

Office.

4.2.

Operation Range

Parameter

Symbol

Limit Values

Unit

Test Condition

min.

typ.

max.

Ambient temperature

-35

+80

°C

—