Nexperia

PCMFxUSB3B/C series

Common-mode EMI filter for differential channels with integrated bidirectional ESD protection

VCL (V)

0

25

20

10

15

5

aaa-028357

10

15

5

20

25

I

(A)

0

Transmission Line Pulse (TLP) = 100 ns;

measured CH_IN to GND

Fig. 13. Dynamic resistance with positive clamping;

typical values

VCL (V)

-25

0

-5

-15

-10

-20

aaa-028358

-15

-10

-20

-5

0

I

(A)

-25

Transmission Line Pulse (TLP) = 100 ns;

measured CH_IN to GND

Fig. 14. Dynamic resistance with negative clamping;

typical values

VCL (V)

0

80

60

20

40

aaa-028359

40

20

60

80

I

(A)

0

Very-Fast Transmission Line Pulse

(VF-TLP) = 5 ns;

measured CH_IN to GND

Fig. 15. Dynamic resistance with positive clamping;

typical values

VCL (V)

-80

0

-20

-60

-40

aaa-028360

-40

-60

-20

0

I

(A)

-80

Very-Fast Transmission Line Pulse

(VF-TLP) = 5 ns;

measured CH_IN to GND

Fig. 16. Dynamic resistance with negative clamping;

typical values

The device uses an advanced clamping structure showing a negative dynamic resistance.

This snap-back behavior strongly reduces the clamping voltage to the system behind the ESD

protection during an ESD event. Do not connect unlimited DC current sources to the data lines to

avoid keeping the ESD protection device in snap-back state after exceeding breakdown voltage

(due to an ESD pulse for instance).

PCMFxUSB3B/C_SER

All information provided in this document is subject to legal disclaimers.

© Nexperia B.V. 2019. All rights reserved

Product data sheet

Rev. 2 — 29 January 2019

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