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HCF4026B 数据表(PDF) 6 Page - STMicroelectronics |
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HCF4026B 数据表(HTML) 6 Page - STMicroelectronics |
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6 / 11 page ![]() HCF4026B 6/11 DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns) (*) Typical temperature coefficient for all VDD value is 0.3 %/°C. (1) Measured with respect to carry output line. Symbol Parameter Test Condition Value (*) Unit VDD (V) Min. Typ. Max. CLOCKED OPERATION tPLH tPHL Propagation Delay Time (Carry Out Line) 5 250 500 ns 10 100 200 15 75 150 tPLH tPHL Propagation Delay Time (Decoded Out Lines) 5 350 700 ns 10 125 250 15 90 180 tTHL tTLH Transition Time (Carry Out Line) 5 100 200 ns 10 50 100 15 25 50 fCL (1) Maximum Clock Input Frequency 5 2.5 5 MHz 10 5.5 11 15 8 16 tWC Clock Pulse Width 5 110 260 ns 10 50 100 15 40 80 tr , tf Clock Input Rise or Fall Time 5 Unlimited µs 10 15 RESET OPERATION tPLH tPHL Propagation Delay Time (Carry Out Line) 5 275 550 ns 10 120 240 15 80 160 tPLH tPHL Propagation Delay Time (Decoded Out Lines) 5 300 600 ns 10 125 250 15 90 180 tWR Reset Pulse Widht 5 100 120 ns 10 50 100 15 25 50 trem Reset Removal Time 5 0 30 ns 10 0 15 15 0 10 |
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