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MAS9280 数据表(PDF) 8 Page - Micro Analog systems |
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MAS9280 数据表(HTML) 8 Page - Micro Analog systems |
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8 / 8 page ![]() DA9280.003 13 July 2006 8 (8) ORDERING INFORMATION Product Code Product Comments Package MAS9280A1TG00 IC FOR VCTCXO For 8pF Crystal load EWS Tested wafers 215 µm MAS9280A1SM06 IC FOR VCTCXO For 8pF Crystal load MSOP-10, T&R/5000 pcs/r. MAS9280A2TG00 IC FOR VCTCXO, CLK and DA pins swapped round For 8pF Crystal load EWS Tested wafers 215 µm MAS9280A3TG00 IC FOR VCTCXO, frequency output fo /2 For 8pF Crystal load EWS Tested wafers 215 µm MAS9280A3SM06 IC FOR VCTCXO, frequency output fo /2 For 8pF Crystal load MSOP-10, T&R/5000 pcs/r. MAS9280B1TG00 IC FOR VCTCXO For 10pF Crystal load EWS Tested wafers 215 µm MAS9280B1SM06 IC FOR VCTCXO For 10pF Crystal load MSOP-10, T&R/5000 pcs/r. MAS9280B2TG00 IC FOR VCTCXO, CLK and DA pins swapped round For 10pF Crystal load EWS Tested wafers 215 µm MAS9280B3TG00 IC FOR VCTCXO, frequency output fo /2 For 10pF Crystal load EWS Tested wafers 215 µm MAS9280B3SM06 IC FOR VCTCXO, frequency output fo /2 For 10pF Crystal load MSOP-10, T&R/5000 pcs/r. Please contact Micro Analog Systems Oy for other wafer thickness options. LOCAL DISTRIBUTOR MICRO ANALOG SYSTEMS OY CONTACTS Micro Analog Systems Oy Kamreerintie 2, P.O. Box 51 FIN-02771 Espoo, FINLAND Tel. +358 9 80 521 Fax +358 9 805 3213 http://www.mas-oy.com NOTICE Micro Analog Systems Oy reserves the right to make changes to the products contained in this data sheet in order to improve the design or performance and to supply the best possible products. Micro Analog Systems Oy assumes no responsibility for the use of any circuits shown in this data sheet, conveys no license under any patent or other rights unless otherwise specified in this data sheet, and makes no claim that the circuits are free from patent infringement. Applications for any devices shown in this data sheet are for illustration only and Micro Analog Systems Oy makes no claim or warranty that such applications will be suitable for the use specified without further testing or modification. |
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