www.ti.com

FEATURES

SN54HC04...JORWPACKAGE

SN74HC04...D,DB,N,NS,ORPWPACKAGE

(TOP VIEW)

1A

V

CC

1

14

1B

4B

2

13

1Y

4A

3

12

2A

4Y

4

11

2B

3B

5

10

2Y

3A

6

9

GND

3Y

7

8

SN54HC04...FKPACKAGE

(TOP VIEW)

NC

Nointernalconnection

–

4

5

6

7

18

17

16

15

4A

NC

4Y

NC

3B

14

1Y

NC

2A

NC

2B

8

1

20

2

19

3

13

9

12

10 11

DESCRIPTION/ORDERING INFORMATION

Y = A

SN54HC08, SN74HC08

QUADRUPLE 2-INPUT POSITIVE-AND GATES

SCLS081F – DECEMBER 1982 – REVISED JANUARY 2007

• Wide Operating Voltage Range of 2 V to 6 V

• Typical t

• Outputs Can Drive Up To 10 LSTTL Loads

• ±4-mA Output Drive at 5 V

• Low Power Consumption, 20-µA Max I

CC

• Low Input Current of 1 µA Max

The ’HC08 devices contain four independent 2-input AND gates. They perform the Boolean function

ORDERING INFORMATION

ODERABLE PART NUMBER

TOP-SIDE MARKING

PDIP – N

Reel of 1000

SN74HC08N

SN74HC08N

Reel of 1000

SN74HC08DE4

SOIC – D

Reel of 2500

SN74HC08DR

HC08

Tube of 250

SN74HC08DT

SN74HC08NSR

SOP – NS

Reel of 2000

HC08

–40

°C to 85°C

SN74HC08NSRG4

SN74HC08DBR

SSOP – DB

Reel of 2000

HC08

SN74HC08DBRE4

Tube of 90

SN74HC08PW

TSSOP – PW

Reel of 2000

SN74HC08PWR

HC08

Tube of 250

SN74HC08PWT

CDIP – J

Reel of 1000

SNJ54HC08J

SNJ54HC08J

–55

°C to 125°C

CFP – W

Reel of 900

SNJ54HC08W

SNJ54HC08W

LCCC –FK

Reel of 2200

SNJ54HC08FK

SNJ54HC08JFK

(1)

Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at

www.ti.com/sc/package.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 1982–2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.