TEST CIRCUIT

Device

Under

Test

G Input

G Input

VCC

S1

RL = 1 kΩ

CL = 50 pF

(see Note A)

VID = ±2.5 V

VOLTAGE WAVEFORMS

tPZL, tPLZ Measurement: S1 to VCC

tPZH, tPHZ Measurement: S1 to GND

1.3 V

G

G

(see Note B)

Output

(with VID = 2.5 V)

Output

(with VID = −2.5 V)

tPZH

tPHZ

tPZH

tPHZ

tPZL

tPLZ

tPZL

tPLZ

VOH −0.5 V

VOL + 0.5 V

VOH −0.5 V

VOL + 0.5 V

3 V

0 V

3 V

0 V

VOH

VOL

VOH

VOL

1.3 V

50%

50%

A Input

B Input

TEST CIRCUIT

VOLTAGE WAVEFORMS

0 V

Output

VOH

VOL

10%

90%

90%

10%

tTLH

tTHL

tPLH

tPHL

2.5 V

−2.5 V

50%

Input

Device

Under

Test

A

B

VCC

CL = 50 pF

(see Note A)

Input

7

AM26C32

www.ti.com

SLLS104L – DECEMBER 1990 – REVISED OCTOBER 2018

Product Folder Links: AM26C32

Submit Documentation Feedback

Copyright © 1990–2018, Texas Instruments Incorporated

7 Parameter Measurement Information

A.

CL includes probe and jig capacitance.

Figure 2. Switching Test Circuit and Voltage Waveforms

A.

CL includes probe and jig capacitance.

B.

The input pulse is supplied by a generator having the following characteristics: PRR = 1 MHz, duty cycle

≤ 50%, tr = tf

= 6 ns.

Figure 3. Enable/Disable Time Test Circuit and Output Voltage Waveforms