ST2054

5/9

otherwise specified.) (See Note 1)

Note 1: Pulse testing techniques maintain junction temperature close to ambient temperature: thermal effect must be takes into account sep-

arately.

Note 2: Specified by design, not production tested.

Note 3: Guaranteed by design.

Figure 3: Test Circuit

Figure 4: Waveform - Propagation Delays (f=1MHz; 50% duty cycle)

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

Sink Current

10

mA

Output Low Voltage

0.5

V

OFF-State Current

1

µA

Fault-Blanking period

2

10

ms