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RHR61 数据表(PDF) 13 Page - STMicroelectronics |
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RHR61 数据表(HTML) 13 Page - STMicroelectronics |
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13 / 20 page ![]() RHR61, RHR64 Radiations 5 Radiations Total ionizing dose (MIL-STD-883 TM 1019) The products guaranteed by radiation within the RHA QML-V system, fully comply with the MIL-STD-883 TM 1019 specification. The RHR61 and RHR64 are RHA QML-V tested and characterized in full compliance with the MIL-STD-883 specification, condition B (between 10 and 100 mrad/s). All parameters provided in Table 4, Table 5, and Table 6 apply to pre-irradiation, Table 7 and Table 8 apply to post-irradiation as follows: • All tests are performed in accordance with MIL-PRF-38535 and the test method 1019 of the MIL-STD-883 for total ionizing dose (TID). • The initial characterization is performed in qualification only on both biased and unbiased parts. • Each wafer lot is tested in the worst bias case condition, based on the results obtained during the initial qualification. Heavy ions The behavior of the product when submitted to heavy ions is not tested in production. Heavy ion trials are performed on qualification lots only. Table 9: Radiations Type Characteristics Value Unit TID Low-dose rate (36 to 360 rad/h) up to: 100 krad Heavy ions SEL immunity up to: (with a particle angle of 60 ° at 125 °C) 120 MeV.cm²/mg SEL immunity up to: (with a particle angle of 0 ° at 125 °C) 60 SET immunity (at 25 °C) Characterized DocID027171 Rev 3 13/20 |
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