CAT28C16A

4

Doc. No. 1076, Rev. D

Figure 1. A.C. Testing Input/Output Waveform(3)

Figure 2. A.C. Testing Load Circuit (example)

Note:

(1) This parameter is tested initially and after a design or process change that affects the parameter.

(2) Output floating (High-Z) is defined as the state when the external data line is no longer driven by the output buffer.

(3) Input rise and fall times (10% and 90%) < 10 ns.

INPUT PULSE LEVELS

REFERENCE POINTS

2.0 V

0.8 V

2.4 V

0.45 V

1.3V

DEVICE

UNDER

TEST

1N914

3.3K

CL = 100 pF

OUT

CL INCLUDES JIG CAPACITANCE

A.C. CHARACTERISTICS, Read Cycle

±10%, unless otherwise specified.

28C16A-9028C16A-12

28C16A-20

Symbol

Parameter

Min

Max

Min

Max

Min

Max

Units

Read Cycle Time

90

120

200

ns

CE Access Time

90

120

200

ns

Address Access Time

90

120

200

ns

OE Access Time

50

60

80

ns

CE Low to Active Output

0

0

0

ns

OE Low to Active Output

0

0

0

ns

CE High to High-Z Output

50

50

55

ns

OE High to High-Z Output

50

50

55

ns

Output Hold from Address Change

0

0

0

ns