MC10153

http://onsemi.com

3

TEST VOLTAGE VALUES (Volts)

@ Test Temperature

–30

°C

–0.890

–1.890

–1.205

–1.500

–5.2

+25

°C

–0.810

–1.850

–1.105

–1.475

–5.2

+85

°C

–0.700

–1.825

–1.035

–1.440

–5.2

Pin

Under

TEST VOLTAGE APPLIED TO PINS LISTED BELOW

(V

)

Characteristic

Symbol

Under

Test

Gnd

Power Supply Drain Current

8

13

8

1, 16

Input Current

3

4

5

13

3

4

5

13

8

8

8

8

1, 16

1, 16

1, 16

1, 16

3

3

8

1, 16

Output Voltage

Logic 1

2

2

3

3

4

13

8

8

1, 16

1, 16

Output Voltage

Logic 0

2

2

2

3,5

3,13

13

3,4

8

8

8

1, 16

1, 16

1, 16

Threshold Voltage

Logic 1

2

2

2

2

[

2

]

2

]

2

2

3

3

3

3

3

4

4

4

3

5

4

13

8

8

8

8

8

8

8

8

1, 16

1, 16

1, 16

1, 16

1, 16

1, 16

1, 16

1, 16

Threshold Voltage

Logic 0

2

2

2

2

[

2

]

2

]

3

3

3

4

4

4

5

3

13

8

8

8

8

8

8

1, 16

1, 16

1, 16

1, 16

1, 16

1, 16

Switching Times

(50

Ω Load)

+1.11 V

Pulse In

Pulse Out

–3.2 V

+2.0 V

Propagation Delay

2

2

2

3

3

3*

3

4

5

3

3

2

2

2

2

2

8

8

8

8

8

1, 16

1, 16

1, 16

1, 16

1, 16

Rise Time

(20 to 80%)

2

3

2

8

1, 16

Fall Time

(20 to 80%)

2

3

2

8

1, 16

[ Output level to be measured after a clock pulse has been applied to the clock input (Pin 4)

] Data input at proper high/low level while clock pulse is high so that device latches ar proper high/low level for test. Levels are measured after

device has latched.

* Latch set to zero state before test.

Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been

established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.

Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the

same manner.