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HCF4536B 数据表(PDF) 9 Page - STMicroelectronics |
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HCF4536B 数据表(HTML) 9 Page - STMicroelectronics |
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9 / 13 page ![]() HCF4536B 9/13 FUNCTIONAL TEST SEQUENCE Test function has been included for the reduction of test time required to exercise all 24 counter stages.This test function divides the counter into three 8-stage section and 255 counts are loaded in each of the 8-stage sections in parallel. All flip-flops are now at a "H". The counter is now returned to the normal 24-steps in series configuration. One more pulse is entered into In1 which will cause the counter to ripple from an all "H" state to an all "L" state. TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance) RL = 200KΩ RT = ZOUT of pulse generator (typically 50Ω) FUNCTIONAL TEST SEQUENCE Inputs Outputs COMMENTS In 1 Set Reset 8-Bypass Decade Out Q1 Thru Q24 All 24 steps are in reset mode HL H H L Counter is in three 8-stage section in parallel mode HH HH L L H H H L First "H" to "L" Transition of Clock H 255 "H" to "L" transitions are clocked in the counter LH H H L H H H H The 255 "H" to "L" Transition LL LL H Counter converted back to 24 stages in series mode. Set and Reset must be connected together and simultaneously go from "H" to "L" HL L L H In1 switches to a "H" LL LLL Counter Ripples from an all "H" state to an all "L" state |
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