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TLS820F3ELV33 数据表(PDF) 7 Page - Infineon Technologies AG

部件名 TLS820F3ELV33
功能描述  OPTIREG™ linear TLS820F3ELV33 Low dropout linear voltage regulator with watchdog and reset
PDF  42 Pages
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制造商  INFINEON [Infineon Technologies AG]
网页  http://www.infineon.com
标志 INFINEON - Infineon Technologies AG

TLS820F3ELV33 数据表(HTML) 7 Page - Infineon Technologies AG

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Datasheet
7
Rev. 1.1
2023-10-16
OPTIREG™ linear TLS820F3ELV33
Low dropout linear voltage regulator with watchdog and reset
General product characteristics
3
General product characteristics
3.1
Absolute maximum ratings
Notes
1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the
data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are
not designed for continuous repetitive operation.
3. Latchup robustness: class II according to AEC - Q100-04.
Table 1
Absolute maximum ratings1)
Tj = -40°C to 150°C; all voltages with respect to ground, positive current flowing into pin
(unless otherwise specified)
1) Not subject to production test, specified by design.
Parameter
Symbol
Values
Unit Note or Test Condition
Number
Min.
Typ. Max.
Voltage rating
Input voltage I
VI
-0.3
45
V
P_3.1.1
Enable voltage EN
VEN
-0.3
45
V
P_3.1.2
Output voltage Q
VQ
-0.3
7
V
P_3.1.3
Reset output RO
VRO
-0.3
7
V
P_3.1.4
Delay voltage D
VD
-0.3
7
V
P_3.1.5
Reset threshold RADJ
VRADJ
-0.3
7
V
P_3.1.6
Watchdog input WI
VWI
-0.3
7
V
P_3.1.7
Watchdog output WO
VWO
-0.3
7
V
P_3.1.8
Watchdog inhibit WINH
VWINH
-0.3
7
V
P_3.1.9
Temperature
Junction temperature
Tj
-40
150
°C
P_3.1.10
Storage temperature
Tstg
-55
150
°C
P_3.1.11
ESD robustness
ESD robustness to GND
VESD,HBM -2
2
kV
2) HBM all pins
2) Human body model (HBM) robustness according to AEC-Q100-002.
P_3.1.12
ESD robustness to GND
VESD,CDM -500
500
V
3) CDM all pins except 1, 7,
8, 14
3) Charged device model (CDM) robustness according to AEC-Q100-011 Rev-D; voltage level refers to test condition (TC)
mentioned in the standard.
P_3.1.13
ESD robustness pins 1, 7, 8, 14
to GND
VESD,CDM -750
750
V
3) CDM
P_3.1.14



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