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STTH6012 数据表(PDF) 4 Page - STMicroelectronics |
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STTH6012 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 8 page ![]() Characteristics STTH6012 4/8 Figure 3. Relative variation of thermal impedance junction to case versus pulse duration Figure 4. Peak reverse recovery current versus dIF/dt (typical values) 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.E-03 1.E-02 1.E-01 1.E+00 Z/R th(j-c) th(j-c) t (s) p Single pulse 0 10 20 30 40 50 60 70 80 0 50 100 150 200 250 300 350 400 450 500 I (A) RM dI /dt(A/µs) F I=I F F(AV) I =0.5 x I F F(AV) V =600V T =125°C R j I =2 x I F F(AV) Figure 5. Reverse recovery time versus dIF/dt (typical values) Figure 6. Reverse recovery charges versus dIF/dt (typical values) 200 300 400 500 600 700 800 900 1000 0 50 100 150 200 250 300 350 400 450 500 t (ns) rr dI /dt(A/µs) F I =2 x I F F(AV) I=I F F(AV) I =0.5 x I F F(AV) V =600V T =125°C R j 0 2 4 6 8 10 12 0 50 100 150 200 250 300 350 400 450 500 Q (µC) rr I =2 x I F F(AV) I =0.5 x I F F(AV) I=I F F(AV) V =600V T =125°C R j dI /dt(A/µs) F Figure 7. Softness factor versus dIF/dt (typical values) Figure 8. Relative variations of dynamic parameters versus junction temperature 0.50 0.75 1.00 1.25 1.50 1.75 2.00 0 50 100 150 200 250 300 350 400 450 500 S factor I 2xI T =125°C F F(AV) j ≤ V =600V R dI /dt(A/µs) F 0.00 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00 25 50 75 100 125 IRM QRR S factor T (°C) j I=I Reference: T =125°C F F(AV) j V =600V R trr |
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