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AM29F080B 数据表(PDF) 38 Page - Advanced Micro Devices |
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AM29F080B 数据表(HTML) 38 Page - Advanced Micro Devices |
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38 / 39 page ![]() 36 Am29F080B 21503G5 November 1, 2006 D A TA SH EE T REVISION SUMMARY Revision A (July 1997) Initial release. Revision B (January 1998) Global Formatted for consistency with other 5.0 volt-only data sheets. Figure 9, Read Operation Timings Corrected RESET# waveform so that it is high for the duration of the read cycle. Figure 11, Chip/Sector Erase Operation Timings Corrected data unlock cycle in diagram to 55h. Figure 17, Alternate CE# Controlled Program Operation Timings Corrected command for sector erase to 30h, chip erase to 10h. Revision C (January 1998) Standby Mode Removed sentence in first paragraph referring to RESET# pulse. Sector Group Protection/Unprotection, Temporary Sector Group Unprotect Changed references from “sector” to “sector group”. Corrected text to indicate sector groups are composed of two adjacent sectors. Revision D (May 1998) Distinctive Characteristics Changed minimum 100K write/erase cycles guaran- teed to 1,000,000. DC Characteristics, CMOS Compatible For ICC3 and ICC4, the voltage tolerances given for CE# and RESET# are now ±0.5 V. AC Characteristics Erase/Program Operations; Erase and Program Oper- ations Alternate CE# Controlled Writes: Corrected the notes reference for tWHWH1 and tWHWH2. These param- eters are 100% tested. Corrected the note reference for tVCS. This parameter is not 100% tested. Temporary Sector Unprotect Table Added note reference for tVIDR. This parameter is not 100% tested. Command Definitions Corrected the shift in the table header. Erase and Programming Performance Changed minimum 100K program and erase cycles guaranteed to 1,000,000. Revision E (January 1999) Global Updated for CS39S process technology. Distinctive Characteristics Added: ■ 20-year data retention at 125°C — Reliable operation for the life of the system DC Characteristics—CMOS Compatible Added note “For CMOS mode only, ICC3 = ICC4 = 20 µA max at extended temperatures (> +85°C)”. DC Characteristics—TTL/NMOS Compatible and CMOS Compatible ICC1, ICC2, ICC3, ICC4: Added Note 2 “Maximum ICC specifications are tested with VCC = VCCmax”. ICC3, ICC4: Deleted VCC = VCCMax. Revision E+1 (March 23, 1999) Operating Ranges The temperature ranges are now specified as ambient. Revision E+2 (April 9, 1999) Ordering Information, Operating Ranges Added the extended temperature range. Revision F (November 15, 1999) AC Characteristics—Figure 11. Program Operations Timing and Figure 12. Chip/Sector Erase Operations Deleted tGHWL and changed OE# waveform to start at high. Physical Dimensions Replaced figures with more detailed illustrations. Revision F+1 (May 18, 2000) DC Characteristics TTL/NMOS Compatible: The ICC2 specifications are now identical to those for CMOS compatible. Revision G (December 4, 2000) Added table of contents. Ordering Information Deleted burn-in option. |
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