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AM29SL800D 数据表(PDF) 29 Page - Advanced Micro Devices |
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AM29SL800D 数据表(HTML) 29 Page - Advanced Micro Devices |
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29 / 46 page ![]() D A TA SH EE T January 23, 2007 27546A6 Am29SL800D 27 TEST CONDITIONS CL Device Under Test Figure 11. Test Setup Table 8. Test Specifications Test Condition -90, -100 -120, -150 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.0 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V Table 9. Key to Switching Waveforms WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 2.0 V 0.0 V 1.0 V 1.0 V Output Measurement Level Input Figure 12. Input Waveforms and Measurement Levels |
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