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PQ1U331M2ZPH 数据表(PDF) 3 Page - Sharp Corporation |
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PQ1U331M2ZPH 数据表(HTML) 3 Page - Sharp Corporation |
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3 / 4 page ![]() 3 Sheet No.: OP06027 PQ1Uxx1M2ZPH Series eo ~ 5 4 2 3 1 V ~ + + + Fig.2 Test Circuit for Ripple Rejection ei VIN VC RL f=400Hz(sine wave) ei(rms)=100mV VIN=VO(TYP)+1.0V VC=1.8V IO=10mA RR=20log(ei(rms)/eo(rms)) Fig.3 Power Dissipation vs. Ambient Temperature Fig.4 Overcurrent Protection Characteristics (Typical Value) Fig.5 Output Voltage Fluctuation vs. Junction Temperature (PQ1U281M2ZPH)(Typical Value) Fig.6 Output Voltage vs. Input Voltage (PQ1U281M2ZPH)(Typical Value) Ambient temperature Ta (°C) Note) Oblique line portion:Overheat protection may operate in this area. 0 25 50 75 100 0 0.1 0.2 0.3 0.4 Output current IO (A) –60 60 50 40 30 20 10 0 –10 –20 –30 –40 –50 –30–20 140 120 100 80 60 40 20 0 Junction temperatureTj (°C) Input voltage VIN (V) 0 4 3 2 1 01234567 0 100 200 300 400 -30 -25 0 25 50 75 85 100 125 150 Ta=25 °C |
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