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ADL8140ACPZN-R7 数据表(PDF) 5 Page - Analog Devices

部件名 ADL8140ACPZN-R7
功能描述  10 GHz to 18 GHz Low Noise Amplifier
PDF  18 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADL8140ACPZN-R7 数据表(HTML) 5 Page - Analog Devices

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Data Sheet
ADL8140
ABSOLUTE MAXIMUM RATINGS
analog.com
Rev. 0 | 5 of 18
Table 5. Absolute Maximum Ratings
Parameter
Rating
VDD
4 V
RF Input Power (RFIN)
20 dBm
Continuous Power Dissipation (PDISS), and TCASE =
85°C (Derate 12.09 mW/°C Above 85°C)
1.09 W
Temperature
Storage Range
−65°C to +150°C
Operating Range
−55°C to +125°C
Quiescent Channel (TCASE = 85°C, VDD = 1.5 V,
IDQ = 35 mA, and Input Power (PIN) = Off)
89.34°C
Maximum Channel
175°C
Stresses at or above those listed under Absolute Maximum Ratings
may cause permanent damage to the product. This is a stress
rating only; functional operation of the product at these or any other
conditions above those indicated in the operational section of this
specification is not implied. Operation beyond the maximum operat-
ing conditions for extended periods may affect product reliability.
THERMAL RESISTANCE
Thermal performance is directly linked to printed circuit board
(PCB) design and operating environment. Careful attention to PCB
thermal design is required.
θJC is the channel-to-case thermal resistance.
Table 6. Thermal Resistance1
Package Type
θJC
Unit
CP-8-30
Quiescent, TCASE = 25°C
68.4
°C/W
Worst Case2, TCASE = 85°C
82.7
°C/W
1 Thermal resistance varies with operating conditions.
2 Across all specified operating conditions.
ELECTROSTATIC DISCHARGE (ESD) RATINGS
The following ESD information is provided for handling of ESD-sen-
sitive devices in an ESD-protected area only.
Human body model (HBM) per ANSI/ESDA/JEDEC JS-001.
ESD Ratings for ADL8140
Table 7. ADL8140, 8-Lead LFCSP
ESD Model
Withstand Threshold (V)
Class
HBM
±300
1A
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Charged devi-
ces and circuit boards can discharge without detection. Although
this product features patented or proprietary protection circuitry,
damage may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to avoid
performance degradation or loss of functionality.



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