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ST3237EBPR 数据表(PDF) 10 Page - STMicroelectronics

部件名 ST3237EBPR
功能描述  ± 15KV ESD-protected, 1μA, 3 to 5.5V, 250Kbps RS-232 Transceiver with stand-by
PDF  17 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

ST3237EBPR 数据表(HTML) 10 Page - STMicroelectronics

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Application note
ST3237E
10/17
6
Application note
This application note describes the procedure for determining the susceptibility and the test
method to verify ST ESD advanced protection on RS-232 or RS485 I/O device.
Static electricity is defined as an electrical charge caused by an imbalance of electrons on
the surface of a material. This imbalance of electrons produces an electric field that can be
measured and that can influence other objects at a distance. Electrostatic discharge is
defined as the transfer of charge between bodies at different electrical potentials.
Electrostatic discharge (ESD) can change the electrical characteristics of a semiconductor
device, degrading or destroying it. Any input or output port (I/O) allows access
communication with other pieces of equipment by external connectors. These connectors
are directly linked by the I/O pins of RS-232 or RS485 interface. ST provides the E-series by
advanced high ESD protection structure. The protection functionality is tested in two
different conditions:
The first model is used to simulate the HUMAN BODY MODEL (HBM) event. A similar
discharge can occur from a charged conductive object, such as a metallic tool or fixture. The
model used to characterize this event is known as the Machine Model. A Human Body
Model circuit and waveform is presented in Figures below.
Figure 7.
Human body model circuit
Figure 8.
Human body model current waveform
The second model is IEC 1000-4-2 and is used to simulate the reaction of the device on
equipment when subjected to electrostatic discharges, which may occur from personnel to
objects near vital instrumentation. Direct (Contact) and indirect (Air Gap) applications of
discharges to the equipment under test (EUT) are possible. Test characteristics are shown
in circuit, waveform and table below.



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