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MCP3301T-CI/P 数据表(PDF) 13 Page - Microchip Technology |
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MCP3301T-CI/P 数据表(HTML) 13 Page - Microchip Technology |
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13 / 32 page ![]() © 2007 Microchip Technology Inc. DS21700C-page 13 MCP3301 3.0 TEST CIRCUITS FIGURE 3-1: Load circuit for TR, TF, TDO FIGURE 3-2: Load circuit for T DIS and TEN. FIGURE 3-3: Power Supply Sensitivity Test Circuit (PSRR). FIGURE 3-4: Full Differential Test Configuration Example. FIGURE 3-5: Pseudo Differential Test Configuration Example. Test Point 1.4V D OUT 3k Ω C L = 100 pF *Waveform 1 is for an output with internal con- ditions such that the output is high, unless dis- abled by the output control. †Waveform 2 is for an output with internal con- ditions such that the output is low, unless dis- Test Point D OUT 3k Ω 100 pF t DIS Waveform 2 t DIS Waveform 1 t EN Waveform V DD V DD/2 V SS V IH T DIS CS D OUT Waveform 1* D OUT Waveform 2† 90% 10% Voltage Waveforms for t DIS 2.63V - + 1k Ω 5V ±500 mVp-p 5VP-P 1k Ω 20 k Ω To V DD on DUT 1k Ω 1/2 MCP602 V DD = 5V 0.1 µF IN(+) IN(-) MCP3301 5V P -P V REF = 5V 5V P -P V CM = 2.5V 1µF 0.1 µF V REF VDD V SS 0.1 µF IN(+) IN(-) MCP3301 V DD=5V V CM=2.5V 5V P -P V REF=2.5V 1µF 0.1 µF V REF VDD V SS |
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