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AM29245EH 数据表(PDF) 13 Page - Advanced Micro Devices |
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AM29245EH 数据表(HTML) 13 Page - Advanced Micro Devices |
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13 / 36 page ![]() P R E L I M I N A R Y 13 Am29240 EH Microcontroller Series ™ RESET Reset (input, asynchronous) This input places the processor in the Reset mode. This signal has special hardening against metastable states, allowing it to be driven with a slow-rise-time signal. ROMCS3–ROMCS0 ROM Chip Selects, Banks 3–0 (output, synchronous) A Low level on one of these signals selects the memory devices in the corresponding ROM bank. ROMCS3 se- lects devices in ROM Bank 3, etc. The timing and access parameters of each bank are individually programmable. ROMOE ROM Output Enable (output, synchronous) This signal enables the selected ROM Bank to drive the ID bus. It is used to prevent bus contention when switch- ing between different ROM banks or switching between a ROM bank and another device or DRAM bank. RSWE ROM Space Write Enable (output, synchronous) This signal is used to write an alterable memory in a ROM bank (such as an SRAM or Flash EPROM). RXDA Receive Data, Port A (input, asynchronous) This input is used to receive serial data to Serial Port A. RXDB Receive Data, Port B (input, asynchronous) This input is used to receive data to Serial Port B. This signal is supported on the Am29240EH and Am29243EH microcontrollers only. STAT2–STAT0 CPU Status (output, synchronous) These outputs indicate information about the processor or the current access for the purposes of hardware debug. TCK Test Clock Input (input, asynchronous, pull-up resistor) This input is used to operate the Test Access Port. The state of the Test Access Port must be held if this clock is held either High or Low. This clock is internally synchro- nized to MEMCLK for certain operations of the Test Ac- cess Port controller, so signals internally driven and sampled by the Test Access Port are synchronous to processor internal clocks. TDI Test Data Input (input, synchronous to TCK, pull-up resistor) This input supplies data to the test logic from an external source. It is sampled on the rising edge of TCK. If it is not driven, it appears High internally. TDMA Terminate DMA (input/output, synchronous) This signal is either an input or an output as controlled by the corresponding DMA Control Register. As an input, this signal can be asserted during an external DMA transfer (non-fly-by) to terminate the transfer after the current access. The TDMA input is ignored during fly-by transfers. As an output, this signal is asserted to indicate the final transfer of a sequence. TDO Test Data Output (three-state output, synchronous to TCK) This output supplies data from the test logic to an exter- nal destination. It changes on the falling edge of TCK. It is in the high-impedance state except when scanning is in progress. TMS Test Mode Select (input, synchronous to TCK, pull-up resistor) This input is used to control the Test Access Port. If it is not driven, it appears High internally. TR/OE Video DRAM Transfer/Output Enable (output, synchronous) This signal is used with video DRAMs to transfer data to the video shift register. It is also used as an output en- able in normal video DRAM read cycles. This signal is supported on the Am29240EH and Am29245EH micro- controllers only. TRAP1–TRAP0 Trap Requests 1–0 (input, asynchronous, internal pull-ups) These inputs generate prioritized trap requests. The trap caused by TRAP0 has the highest priority. These trap requests are disabled by the DA bit of the Current Processor Status Register. These signals have special hardening against metastable states, allowing them to be driven with slow-transition-time signals. |
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