2 Mechanical and Electrical Specifications

LIS2L02AQ3

6/17

CD00059664

3 Guaranteed by wafer level test and measurement of initial offset and sensitivity

4 Zero-g level and sensitivity are essentially ratiometric to supply voltage

5 Guaranteed by design

6 Contribution to the measuring output of the inclination/acceleration along any perpendicular

axis

8 Self test “output voltage change” varies cubically with supply voltage

9 When full-scale is set to ±6g, self-test “output voltage change” is one third of the specified value

10 Minimum resonance frequency Fres=1.5KHz. Sensor bandwidth=1/(2*

π*110KΩ*Cload) with

Cload>1nF.

2.2

Electrical Characteristics

Note: 1 The product is factory calibrated at 3.3V

2 Typical specifications are not guaranteed

3 Minimum resonance frequency Fres=1.5KHz. Sensor bandwidth=1/(2*

π*110KΩ*Cload) with

Cload>1nF

Table 3.

(Temperature range -40°C to +85°C) All the parameters are specified @ Vdd =3.3V, T=25°C

unless otherwise noted

Symbol

Parameter

Test Condition

Min.

Max.

Unit

Vdd

Supply Voltage

2.4

3.3

5.25

V

Idd

Supply Current

mean value

PD pin connected to

GND

0.85

1.5

mA

IddPdn

Supply Current in Power

Down Mode

rms value

PD pin connected to Vdd

25

µA

Vst

Self Test Input

Logic 0 level

0

0.8

V

Logic 1 level

2.2

Vdd

V

Rout

Output Impedance

80

110

140

k

Ω

Cload

320

pF

Ton

Turn-On Time at Exit

From Power Down Mode

Cload in

µF

550*Cload+0.3

ms

Top

Operating Temperature

Range

-40

+85

°C