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P3C1256 数据表(PDF) 3 Page - Pyramid Semiconductor Corporation

部件名 P3C1256
功能描述  HIGH SPEED 32K x 8 3.3V STATIC CMOS RAM
PDF  10 Pages
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制造商  PYRAMID [Pyramid Semiconductor Corporation]
网页  http://www.pyramidsemiconductor.com
标志 PYRAMID - Pyramid Semiconductor Corporation

P3C1256 数据表(HTML) 3 Page - Pyramid Semiconductor Corporation

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P3C1256
Page 3 of 10
Document # SRAM122 REV B
AC ELECTRICAL CHARACTERISTICS - READ CYCLE
(Over Recommended Operating Temperature & Supply Voltage)
CAPACITANCES(4)
(V
CC = 5.0V, TA = 25°C, f = 1.0 MHz)
Symbol
Parameter
Test Conditions
Max
Unit
C
IN
C
OUT
Input Capacitance
Output Capacitance
V
IN = 0V
V
OUT = 0V
10
10
pF
pF
Symbol
Parameter
Min
Unit
t
RC
ns
t
AA
Address Access Time
t
AC
Chip Enable Access
Time
t
OH
Output Hold from
Address Change
ns
t
LZ
Chip Enable to
Output in Low Z
ns
t
HZ
Chip Disable to
Output in High Z
ns
t
OE
Output Enable Low
to Data Valid
ns
t
OLZ
Output Enable Low to
Low Z
ns
t
OHZ
Output Enable High
to High Z
t
PU
Chip Enable to Power
Up Time
ns
t
PD
Chip Disable to
Power Down Time
ns
Read Cycle Time
2
2
0
-12
ns
ns
ns
-25
-20
-15
Max
Min
Max
25
25
25
2
2
10
12
0
10
0
20
Min
20
20
20
2
2
9
11
0
9
0
20
Max
Min
Max
15
15
15
2
2
8
9
0
7
0
15
12
12
12
7
7
0
6
12
*Tested with outputs open and all address and data inputs changing at the maximum write-cycle rate.
The device is continuously enabled for writing, i.e., CE, and WE
V
IL (max), OE is high. Switching inputs are 0V
and 3V.
POWER DISSIPATION CHARACTERISTICS VS. SPEED
Symbol
Parameter
Unit
I
CC
Dynamic Operating Current
Commercial
Industrial
mA
mA
Temperature
Range
-12
110
N/A
-15
100
115
-20
95
110
-25
90
105
Test
Conditions
*
*



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