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IDT71342LA55PF 数据表(PDF) 9 Page - Integrated Device Technology

部件名 IDT71342LA55PF
功能描述  HIGH SPEED 4K X 8 DUAL-PORT STATIC RAM WITH SEMAPHORE
PDF  14 Pages
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制造商  IDT [Integrated Device Technology]
网页  http://www.idt.com
标志 IDT - Integrated Device Technology

IDT71342LA55PF 数据表(HTML) 9 Page - Integrated Device Technology

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6.42
IDT71342SA/LA
High-Speed 4K x 8 Dual-Port Static RAM with Semaphore
Industrial and Commercial Temperature Ranges
9
CE or SEM
2721 drw 10
tAW
tAS
tWR
tDW
DATAIN
ADDRESS
tWC
R/
W
tWP
tDH
DATAOUT
tWZ
(4)
(4)
tOW
OE
tHZ
tLZ
tHZ
(9)
(6)
(7)
(2)
(3)
(7)
(7)
TIMING WAVEFORM OF WRITE CYCLE NO. 1, R/
W
W
W
W
W CONTROLLED TIMING(1,5,8)
Timing Waveform of Write Cycle No. 2, CE Controlled Timing(1, 5)
NOTES:
1. R/
W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of either
CE or SEM = VIL and R/W = VIL.
3. tWR is measured from the earlier of
CE or R/W going HIGH to the end-of-write cycle.
4. During this period, the I/O pins are in the output state, and input signals must not be applied.
5. If the
CE LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal (
CE or R/W) is asserted last.
7. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
(Figure 2).
8. If
OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off data to be placed on the bus
for the required tDW. If
OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified tWP.
9. To access SRAM,
CE =VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. Either condition must be valid for the entire tEW time.
2721 drw 11
R/
W
tWC
ADDRESS
DATAIN
CE or SEM
tDW
tWR
tDH
tEW
tAS
tAW
(9)
(6)
(2)
(3)



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