| 数据搜索系统,热门电子元器件搜索 |
|
REF5010 数据表(PDF) 22 Page - Texas Instruments |
|
|
|
|||||||||||||||||||||||||||||
REF5010 数据表(HTML) 22 Page - Texas Instruments |
|
22 / 46 page ![]() 8.3.3 Thermal Hysteresis Thermal hysteresis for the REF50xx is defined as the change in output voltage after operating the device at 25°C, cycling the device through the specified temperature range, and returning to 25°C. Thermal hysteresis can be expressed as Equation 4: PRE POST 6 HYST NOM V V V 10 (ppm) V æ ö - = × ç ÷ ç ÷ è ø (4) where • VHYST = thermal hysteresis (in units of ppm) • VNOM = the specified output voltage • VPRE = output voltage measured at 25°C pre-temperature cycling • VPOST = output voltage measured after the device has been cycled from 25°C through the specified temperature range of –40°C to 125°C and returned to 25°C 8.3.4 Noise Performance Typical 0.1Hz to 10Hz voltage noise for each member of the REF50xx family is specified in the Electrical Characteristics table. The noise voltage increases with output voltage and operating temperature. Additional filtering can be used to improve output noise levels, although take care to make sure the output impedance does not degrade performance. For additional information about how to minimize noise and maximize performance in mixed-signal applications such as data converters, refer to the How a Voltage Reference Affects ADC Performance Part 1, How a Voltage Reference Affects ADC Performance Part 2, and How a Voltage Reference Affects ADC Performance Part 3 analog design journals. DNC TEMP V OUT V IN GND DNC NC TRIM/NR REF50xx C1 1 F m +V SUPPLY Figure 8-4. Noise Reduction Using the TRIM/NR Pin 8.3.5 Long-Term Stability Due to aging and environmental effects, all semiconductor devices experience physical changes of the semiconductor die and the packaging material over time. These changes and the associated package stress on the die cause the output voltage in precision voltage references to deviate over time. The value of such change is specified in the data sheet by a parameter called the long-term stability (also known as the long-term drift (LTD)). Equation 5 shows how LTD is calculated. Note that the LTD value is positive if the output voltage drifts higher over time and negative if the voltage drifts lower over time. Figure 6-23 through Figure 6-30 show the drift of the output voltage for REF50xx over the first 4000 operating hours. OUT OUT 6 t 0 t n t n OUT t 0 (V V ) LTD(ppm) 10 V u (5) where • LTD(ppm)|t=n = long-term stability (in units of ppm) • VOUT|t=0 = output voltage at time = 0 hr REF5010, REF5020, REF5025, REF5030, REF5040, REF5045, REF5050 SBOS410L – JUNE 2007 – REVISED OCTOBER 2024 www.ti.com 22 Submit Document Feedback Copyright © 2024 Texas Instruments Incorporated Product Folder Links: REF5010 REF5020 REF5025 REF5030 REF5040 REF5045 REF5050 |
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |