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DAC8564IDPWR 数据表(PDF) 39 Page - Texas Instruments

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部件名 DAC8564IDPWR
功能描述  16-Bit, Quad Channel, Ultra-Low Glitch, Voltage Output DIGITAL-TO-ANALOG CONVERTER with 2.5V, 2ppm/째C Internal Reference
PDF  46 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

DAC8564IDPWR 数据表(HTML) 39 Page - Texas Instruments

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PARAMETER DEFINITIONS
STATIC PERFORMANCE
Resolution
Full-Scale Error
Offset Error
Least Significant Bit (LSB)
Zero-Code Error
Most Significant Bit (MSB)
Relative Accuracy or Integral Nonlinearity (INL)
Gain Error
Full-Scale Error Drift
Differential Nonlinearity (DNL)
Offset Error Drift
DAC8564
SBAS403A – JUNE 2007 – REVISED NOVEMBER 2007
With the increased complexity of many different specifications listed in product data sheets, this section
summarizes selected specifications related to digital-to-analog converters.
Static performance parameters are specifications such as differential nonlinearity (DNL) or integral nonlinearity
(INL). Those are dc specifications and provide information on the accuracy of the DAC. They are most important
in applications where the signal is slowly changing and accuracy is required.
Generally, the DAC resolution can be expressed in
Full-scale error is defined as the deviation of the real
different forms. Specifications such as IEC 60748-4
full-scale output voltage from the ideal output voltage
recognize
the
numerical,
analog,
and
relative
while the DAC register is loaded with the full-scale
resolution. The numerical resolution is defined as the
code (0xFFFF). Ideally, the output should be VDD – 1
number of digits in the chosen numbering system
LSB. The full-scale error is expressed in percent of
necessary to express the total number of steps of the
full-scale range (%FSR).
transfer characteristic, where a step represents both
a digital input code and the corresponding discrete
analogue output value. The most commonly-used
The offset error is defined as the difference between
definition of resolution provided in data sheets is the
actual output voltage and the ideal output voltage in
numerical resolution expressed in bits.
the linear region of the transfer function. This
difference is calculated by using a straight line
defined by two codes (code 485 and 64714). Since
The least significant bit (LSB) is defined as the
the offset error is defined by a straight line, it can
smallest value in a binary coded system. The value of
have a negative or positve value. Offset error is
the LSB can be calculated by dividing the full-scale
measured in mV.
output voltage by 2n, where n is the resolution of the
converter.
The zero-code error is defined as the DAC output
voltage, when all '0's are loaded into the DAC
The most significant bit (MSB) is defined as the
register. Zero-scale error is a measure of the
largest value in a binary coded system. The value of
difference between actual output voltage and ideal
the MSB can be calculated by dividing the full-scale
output voltage (0V). It is expressed in mV. It is
output voltage by 2. Its value is one-half of full-scale.
primarily caused by offsets in the output amplifier.
Relative accuracy or integral nonlinearity (INL) is
Gain error is defined as the deviation in the slope of
defined as the maximum deviation between the real
the real DAC transfer characteristic from the ideal
transfer function and a straight line passing through
transfer function. Gain error is expressed as a
the endpoints of the ideal DAC transfer function. DNL
percentage of full-scale range (%FSR).
is measured in LSBs.
Full-scale error drift is defined as the change in
Differential nonlinearity (DNL) is defined as the
full-scale
error
with
a
change
in
temperature.
maximum deviation of the real LSB step from the
Full-scale
error
drift
is
expressed
in
units
of
ideal 1LSB step. Ideally, any two adjacent digital
%FSR/
°C.
codes correspond to output analog voltages that are
exactly one LSB apart. If the DNL is less than 1LSB,
the DAC is said to be monotonic.
Offset error drift is defined as the change in offset
error with a change in temperature. Offset error drift
is expressed in
µV/°C.
Copyright © 2007, Texas Instruments Incorporated
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