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TC74HC574AP 数据表(PDF) 3 Page - Toshiba Semiconductor

部件名 TC74HC574AP
功能描述  CMOS Digital Integrated Circuit Silicon Monolithic Octal D-Type Filp-Flop with 3-State Output
PDF  9 Pages
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制造商  TOSHIBA [Toshiba Semiconductor]
网页  http://www.semicon.toshiba.co.jp/eng
标志 TOSHIBA - Toshiba Semiconductor

TC74HC574AP 数据表(HTML) 3 Page - Toshiba Semiconductor

  TC74HC574AP Datasheet HTML 1Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 2Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 3Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 4Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 5Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 6Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 7Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 8Page - Toshiba Semiconductor TC74HC574AP Datasheet HTML 9Page - Toshiba Semiconductor  
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TC74HC564AP/AF,574AP/AF
2007-10-01
3
System Diagram
TC74HC564A
TC74HC574A
Absolute Maximum Ratings (Note 1)
Characteristics
Symbol
Rating
Unit
Supply voltage range
VCC
−0.5 to 7
V
DC input voltage
VIN
−0.5 to VCC + 0.5
V
DC output voltage
VOUT
−0.5 to VCC + 0.5
V
Input diode current
IIK
±20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±35
mA
DC VCC/ground current
ICC
±75
mA
Power dissipation
PD
500 (DIP) (Note 2)/180 (SOP)
mW
Storage temperature
Tstg
−65 to 150
°C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: 500 mW in the range of Ta
= −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be
applied until 300 mW.



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